Karri, Gupta Assess Status Quo of Cybersecurity in Digital Manufacturing

As digital manufacturing continues to grow in popularity, it also becomes a more visible attack surface for hackers. Recently a team of researchers from NYU Tandon School of Engineering and Texas A&M teamed up to survey the cybersecurity risks in the emerging DM context, assess the impact on manufacturing, and identify approaches to better secure the technology. The team, which included NYU Tandon faculty members Dr. Ramesh Karri, a professor of electrical and computer engineering and Dr. Nikhil Gupta, a professor of materials and engineering, published their findings in an invited paper in the Proceedings of the IEEE in November.

The research was funded in part by the National Science Foundation. In addition to Gupta and Karri, the investigators are Priyanka Mahesh, a graduate research assistant at NYU Tandon, Chenglu Jin from the Center for Urban Science and Progress and the Center for
Cybersecurity at NYU, Akash Tiwari and Satish T. S. Bukkapatanam with the Department of Industrial and Systems Engineering at Texas A&M University, and Panganamala R. Kumar and A. L. Narasimha Reddy with the
Department of Electrical and Computer Engineering at Texas A&M.