Chandra K. H. Suresh, Ozgur Sinanoglu, and Sule Ozev
In this article, we present several adaptive strategies to enable adaptive unknown bit masking for faster-than-at-speed testing so as to ensure no yield loss while attaining the maximum test quality based on tester memory constraints. We also develop a tester-enabled compression scheme that helps alleviate memory constraints further, shifting the tradeoff space favorably to improve test quality.