Variability and Reliability Awareness in the Age of Dark Silicon

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Florian Kriebel, Muhammad Shafique, Semeen Rehman, Jörg Henkel and Siddharth Garg
Ability to supply more transistors per chip is outpacing improvements in cooling and power delivery. The result is operation that selectively powers on or off subsets of transistors. This paper suggests innovate ways to take advantage of the consequent “dark” silicon to meet a pair of additional emerging challenges-reliability and tolerance of variability.